Showing results: 1021 - 1035 of 2704 items found.
-
AMETEK VTI Instruments
The first VXIbus specification was introduced to the test and measurement community in 1987 and was initially developed to provide a card-based instrumentation platform for applications that required high density and high performance. The platform continues to thrive today by leveraging off the original specifications which define the necessary physical (real estate/cooling) and electrical standards for demanding applications and has established itself as the ‘time-tested bus you can trust’ for requirements that must be supported in excess of ten-fifteen years.
-
34947A -
Keysight Technologies
The Keysight 34947A microwave switch for the 34980A Multifunction Switch/Measure Unit offers bi-directional switching for test signals from DC to 26.5 GHz. These switches provide excellent insertion loss, isolation, and VSWR specification. The microwave switches are configured as three independent 1x2 (SPDT) unterminated switches on a single module. For general-purpose microwave switching applications, the module can be used to switch separate signal sources for a multi-band receiver/transmitter testing application.
-
34946A -
Keysight Technologies
The Keysight 34946A microwave switch for the 34980A Multifunction Switch/Measure Unit offers bi-directional switching for test signals from DC to 26.5 GHz. These switches provide excellent insertion loss, isolation, and VSWR specification. The microwave switches are configured as two independent 1x2 (SPDT) terminated switches on a single module. For general-purpose microwave switching applications, the module can be used to switch separate signal sources for a multi-band receiver/transmitter testing application.
-
TP121-TH -
Gigahertz-Optik GmbH
The photometric specifications of LEDs must meet very high tolerance requirements regardless of whether they are to be used in general, automotive or other specialist lighting applications. This is often a problem since the manufacturing tolerances of LEDs can be higher than those permitted in the end-use applications. Also, LED binning by LED manufacturers in order to classify LEDs based on their tolerances is performed with flash mode testing using pulsed current flow. However, end-use applications of the LEDs often operate in constant current mode and with significant thermal effects. The sophisticated LED processing industry therefore requires measurement devices that can be used for both manufacturer-compliant pulsed mode, as well as constant current operation mode. When the LEDs are run in constant current mode, the junction temperature has significant influence on the performance and lifetime of the LED. Therefore, test systems should be able to test the LEDs at specific junction temperatures.
-
Model TRSIG-1 -
Aplab Limited
Aplab Track-Signal Test Meter incorporates Digital Signal Processing based design to provide high accuracy and stability. It is designed for level measurement of selected frequencies. It also provides functionality of AC and DC voltage measurements.The purpose of Track-Signal Test Meter is to make adjustments, control measurements and inspections on both audio frequency track circuits of types FTGS 46, FTGS 917 and also for TI21M type track circuits (now known as BI track 300) for the measurement of eight frequencies from 5700Hz to 8500Hz for metro applications. Its compactness and battery operation render the unit particularly suitable for portable applications in maintenance and for level measurement in communication systems.
-
783801-01 -
NI
16-Bit, 64-Channel, 1 MS/s PXI Analog Output Module—The PXIe‑6739 is a high-density analog output module. The device is ideal for applications such as stimulus-response tests and open-loop simulations at high densities. You can achieve the maximum sample rate if using up to 16 channels, where each channel is on a separate bank. The PXIe‑6739 also includes 20 digital I/O lines, four counter/timers, digital triggering, and advanced timing to meet a wide range of application requirements. Its digital triggering and PXI Express synchronization capabilities allow it to be coupled with additional data acquisition, motion, and vision products to create highly custom measurement solutions to test innovative designs.
-
783800-01 -
NI
16-Bit, 32-Channel, 1 MS/s PXIe Analog Output Module—The PXIe‑6738 is a high-density analog output module. The device is ideal for applications such as stimulus-response tests and open-loop simulations at high densities. You can achieve the maximum sample rate if using up to eight channels, where each channel is on a separate bank. The PXIe‑6738 also includes 10 digital I/O lines, four counter/timers, digital triggering, and advanced timing to meet a wide range of application requirements. Its digital triggering and PXI Express synchronization capabilities allow it to be coupled with additional data acquisition, motion, and vision products to create highly custom measurement solutions to test innovative designs.
-
UNH IOL
Our IPv6 testing services prove interoperability and functionality for IPv6 networks. Our testing includes coverage for IPv6 Host and Router, CE Router, IPv6 Applications and Network Protection Products. We offer ISO/IEC 17025 accredited testing for both the USGv6 and IPv6 Ready Logo test programs. In addition, customers may license our custom test tool IOL INTACT® for pretesting and internal validation.
-
DMM -
Konrad Technologies GmbH
It consists of three modules:- A windows driver which is responsible for the communication and device abstraction- A DLL with NI TestStand Test Steps which allows easy integration in automated production enironments- A standalone executable which simplifies debugging and setup of test sequencesThis architecture allows to open a communication channel from multiple instances to the same device. This is important when for example two channels of a measurement device are used in two independent applications.
-
Konrad DCPower -
Konrad Technologies GmbH
It consists of three modules:- A windows driver which is responsible for the communication and device abstraction- A DLL with NI TestStand Test Steps which allows easy integration in automated production environments- A standalone executable which simplifies debugging and setup of test sequencesThis architecture allows to open a communication channel from multiple instances to the same device. This is important when for example two channels of a power supply are used in two independent applications.
-
Konrad DigitalIO -
Konrad Technologies GmbH
It consists of three modules:- A windows driver which is responsible for the communication and device abstraction- A DLL with NI TestStand Test Steps which allows easy integration in automated production environments- A standalone executable which simplifies debugging and setup of test sequencesThis architecture allows to open a communication channel from multiple instances to the same device. This is important when for example an I/O channel should be used in two independent applications.
-
CMT Series -
Jinan Testing Equipment IE Corporation
The CMT series single screw testing machine is designed for mechanical property test mainly on metal materials, cement, asphalt, and bitumen etc. A variety of fixtures can be offered to do compression, bending and shearing test as well. This series of single screw testing machine is suitable for the applications in quality inspection, research, metallurgy, rubber & plastics, and knitting materials, and widely used in many fields such as industry factories, mineral enterprise and high schools.
-
11021/11021-L -
Chroma Systems Solutions, Inc.
The Chroma 11021/11021-L are the most cost-effective digital LCR Meters available, providing 100Hz, 120Hz, 1kHz, and 10kHz test frequencies for the 11021 and 1kHz, 10kHz, 40kHz, 50kHz test frequencies for the 11021-L. The standard RS232 interface, optional GPIB & Handler interfaces, high speed and stable measurement capabilities enable the Chroma 11021/11021-L for use in both component evaluation on the production line and fundamental impedance testing for bench-top applications.
-
Chroma 11021/11021-L -
Chroma Systems Solutions, Inc.
The Chroma 11021/11021-L are the most cost-effective digital LCR Meters, providing 100Hz, 120Hz, 1kHz, and 10kHz test frequencies for the 11021 and 1kHz, 10kHz, 40kHz, 50kHz test frequencies for the 11021-L. Standard RS232 interface, optional GPIB & Handler interface, high speed and stable measurement capabilities enable the Chroma 11021/11021-L can be used for both component evaluation on the production line and fundamental impedance testing for bench-top applications.
-
SIFT -
FA Instruments
SIFT allows for the analysis of numerous stimuli to identify speed, fault, and parametric differences in silicon. The heart of the SIFT technique revolves around intentionally disturbing devices with external stimuli and comparing the test criteria to reference parts or timing/voltage sensitivities. Synchronous interfacing is possible to any tester without any wiring or program changes. The system can be based on either a motorized probe station or portable microscope stand for test head applications.
